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8 дней назад

Materials Analyst, Microscopy (Dual Beam FIB)

75 000 - 85 000$
Формат работы
onsite
Тип работы
fulltime
Английский
b2
Страна
US
Вакансия из списка Hirify.GlobalВакансия из Hirify Global, списка международных tech-компаний
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Описание вакансии

Текст:
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TL;DR
Materials Analyst, Microscopy (Dual Beam FIB) (Advanced Materials and Semiconductor Analysis): Preparing site-specific TEM lamellae with Dual Beam FIB-SEM systems and performing SEM imaging for materials characterization and failure analysis with an accent on precise sample preparation, microscopy workflows, and quality verification. Focus on independently operating advanced instrumentation, managing multiple client samples, and delivering timely results in a deadline-driven laboratory environment.

Location: Phoenix, Arizona, USA; onsite laboratory role. Work schedule: 5:00 p.m.–2:00 a.m. with a 10% evening shift differential. Applicants must be U.S. Persons under ITAR requirements: U.S. citizens or U.S. permanent residents.

Salary: USD 75,000–85,000 per year.

Company

Eurofins EAG Laboratories provides engineering, materials testing, analytical chemistry, microscopy, surface analysis, and engineering services for industries including semiconductors, electronics, pharmaceuticals, medical devices, energy, and consumer products.

What you will do

  • Prepare high-quality, site-specific TEM lamellae from novel materials and advanced semiconductor devices using Dual Beam FIB-SEM systems.
  • Perform SEM imaging for sample navigation, preparation, and quality verification.
  • Manage multiple client samples while meeting internal quality standards and turnaround commitments.
  • Optimize microscopy workflows with the team to improve efficiency and maintain consistent output.
  • Collaborate with analytical teams and clients to clarify analysis requirements and follow standardized procedures.

Requirements

  • B.S. or M.S. in Materials Science and Engineering or a related field, or equivalent hands-on industry experience; the role is not intended for PhD-level candidates.
  • Hands-on experience with Dual Beam FIB-SEM systems, or strong academic or early-industry experience demonstrating the ability to execute sample-preparation workflows independently.
  • Working knowledge of electron microscopy principles, including SEM and TEM.
  • Understanding of semiconductor device physics and failure-analysis concepts from coursework, laboratory work, or industry experience.
  • Strong problem-solving and prioritization skills for a fast-paced, deadline-driven laboratory environment.
  • U.S. Person status is required for ITAR-regulated work.

Nice to have

  • Expertise in TEM lamella preparation, including lift-out and site-specific techniques.
  • Advanced SEM imaging experience.
  • Experience in high-throughput or production laboratory environments.
  • Clear, timely technical communication with internal teams and external clients.

Culture & Benefits

  • Extensive, uninterrupted hands-on instrument time and exposure to advanced materials and semiconductor technologies.
  • Collaborative environment focused on technical excellence and continuous improvement.
  • Career development programs, goal setting, mentoring, and education assistance.
  • Medical, dental, and vision coverage, 401(k) company matching, paid time off, wellness programs, and volunteer time off.
  • Team-oriented and inclusive workplace supporting diversity and authenticity.

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