Sr Assoc Eng Failure Analysis (Semiconductors)

Location: Singapore; 12-hour night-shift pattern required

Company

hirify.global manufactures essential semiconductors for high-growth markets, including AI applications, through operations across the U.S., Europe, and Asia.

What you will do

• Perform Transmission Electron Microscopy (TEM) analysis and prepare TEM samples using Focused Ion Beam (FIB) systems.
• Prepare samples before FIB processing through wafer cleaving, optical inspection, defect navigation, coating, delayering, RIE, and polishing.
• Operate FIB systems for precision milling, thinning, and lamella preparation.
• Conduct TEM profiling and measurements using bright-field and scanning-mode imaging, including EDX material-element analysis.
• Support urgent requests from fabrication and failure-analysis teams while maintaining sample quality, cleanliness, and thickness requirements.
• Follow laboratory safety procedures and SOPs, communicate across shifts, and contribute to continuous improvement.

Requirements

• Diploma in Electrical, Electronics, Mechatronics, or Microelectronics Engineering.
• Availability for a 12-hour night-shift pattern.
• Basic knowledge of the semiconductor field and strong hands-on capability.
• Fast learning ability, problem-solving skills, and the capacity to work independently under time pressure.
• Good interpersonal and communication skills, with the ability to work effectively with engineers, peers, and shift counterparts.

Nice to have

• Hands-on experience with FIB for TEM sample preparation.
• Knowledge of TEM and FIB systems.

Culture & Benefits

• Inclusive and multicultural workplace focused on respect, diversity, and collaboration.
• Commitment to security, longevity, sustainability, and continuous improvement.
• Employment is subject to background checks, applicable medical screening, and local laws.
• No recruitment fees are charged at any stage of the hiring process.