Materials Scientist, Dual Beam Analysis (FIB/SEM)

Location: Milpitas, California, USA; onsite laboratory role

Salary: USD 118,000–130,000 per year

Company

Eurofins EAG Laboratories provides engineering, materials testing, analytical chemistry, microscopy, and scientific services across semiconductor, electronics, pharmaceutical, medical device, energy, and consumer product industries.

What you will do

• Operate Dual Beam FIB/SEM systems and perform TEM lamella preparation, SEM imaging, and EDS analysis.
• Develop automation workflows for lamella preparation, cross-sectioning, and imaging.
• Maintain FIB sample preparation, SEM imaging, and data acquisition pipelines.
• Process and analyze 2D/3D FIB/SEM datasets and support critical dimension measurements.
• Improve service throughput, repeatability, and data quality.
• Collaborate with cross-functional teams and provide technical consultation for failure analysis and materials characterization projects.

Requirements

• MS or PhD in Materials Science and Engineering or a related field, or equivalent industrial experience.
• In-depth knowledge of electron microscopy and Dual Beam FIB/SEM imaging is required.
• Expertise with SEM/EDX or TEM sample preparation.
• Understanding of semiconductor device physics and failure analysis.
• Strong written, verbal, and presentation communication skills.
• Availability for the 5 p.m.–2 a.m. schedule, Tuesday through Saturday.

Nice to have

• Experience with semiconductor chip products and wafer samples.

Culture & Benefits

• Collaborative laboratory environment focused on precision, curiosity, and technical problem solving.
• Medical, dental, and vision insurance.
• 401(k) company matching.
• Wellness program, fitness reimbursement, and volunteer time off.
• Education assistance and career development programs.
• Shift differential for the scheduled evening shift.